Cryoelectronics Laboratory
Our Microelectronics group has been working on this discipline since 1996. At that time, our laboratory obtained an open-cycle cryostat, which with the appropriate installations and our general measurement facilities, allow for the optical and electrical characterization of devices and IC’s, in the 4.2 K - 300 K temperature range.
Among several activities, this lab is devoted to support the needs of our Microelectronics group when the temperature is a variable for characterizing semiconductor devices and integrated circuits. It is worth mentioning that these facilities are also devoted to the development of cold infrared detectors (for long wave-length radiation), and specially dedicated to the study of thermal properties, thermal sensors, and cryogenic read-out circuitry for several applications.
Head Researcher: Dr. Francisco Javier De la Hidalga Wade
Address: Luis Enrique Erro # 1, Tonantzintla, Puebla, Mexico | Tel: (222) 247. 27.42 | Contact: mcampos@inaoep.mx | Fax: 247.27.42
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