INAOE : : LATW2008

TTEP TUTORIALS

Sunday, February 17

9:30 to 1:00	Design for Yield and Reliability Yervant Zorian, Virage Logic, USA zorian@viragelogic.com

1:00 to 3:00	Lunch

3:00 to 6:30	Practices in Analog, Mixed-signal and RF Testing Salem Abdennadher, Intel, salem.abdennadher@intel.com Saghir Shaikh, Cadence saghir@cadence.com

Tutorial Fee
IEEE Computer Society Member	US$20.00
Non-Member	US$25.00