INAOE ITESO Innovative Design & Test Group

Technical Program

Functional test of processor-based systems: state-of-the-art and current trends


Presenter: Matteo Sonza Reorda
Politecnico de Torino, Italy.

Email: matteo.sonzareorda@polito.it


Matteo Sonza Reorda Biography

 

Variations and Edging – Twins of Electronic Systems Quality


Presenter: Manfred Dietrich
Fraunhofer Gesellschaft, Institut IIS/EAS Dresden, Germany

Email: manfred.dietrich@eas.iis.fraunhofer.de


Manfred Dietrich Biography

 

Combined Effects of Ionizing Radiation and Electromagnetic Interference in Modern ICs: Comprehension and Current Solutions


Presenter: Fabian Vargas
Catholic University of Rio Grande do Sul, Brazil.

Email: vargas@computer.org


Fabian Vargas Biography

 

Design and Verification Methodologies for Mixed Signal IP Systems.


Presenter: Alexandro Giron
Freescale, Mexico

Email: Alex.Giron@freescale.com


Alexandro Giron Biography

 

Reconfigurable Architectures for Safety-Critical Application


Presenter: Mario Scholzel
IHP Frankfurt (Oder) and University of Potsdam, Germany

Email: schoelzel@ihp-microelectronics.com


Mario Scholzel Biography

 

IC Reliability: Failures, Modeling, impact and Future challenges


Presenter: Said Hamdioui
Delft University of Technology, The Netherlands

Email: S.Hamdioui@tudelft.nl


Said Hamdioui Biography

 

Verification of High Performance Analog Systems: from Design Specifications to Successful Silicon Implementation


Presenter: Esdras Juarez
Freescale, Mexico

Email: esdras@freescale.com


Esdras Juarez Biography

 

Open House in Facilities of Freescale Semiconductors
Guadalajara, Jalisco


See information of Freescale
Coordinator: Federico Lobato