Welcome
Call for Papers
Paper Submission
Advance Program
TTEP Tutorials
Registration
Hotel Information
Travelling Information
Tourist Information
Committees
Gallery LATW 2007
Free Rooms for Students

 Holiday Inn La Noria, Puebla
Call for Papers
(Download CFP in PDF format) (Download Poster)

The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind. The best papers presented at the 9th LATW will be invited for submission to the IEEE Design and Test of Computers and Journal of Integrated Circuits and Systems.

Topics of interest include but are not limited to:

  • Analog Mixed Signal Test
  • Automatic Test Generation
  • Board and System Test
  • Built-In Self-Test
  • Defect-Based Test
  • Dependability
  • Design and Synthesis for Testability
  • Design Verification/Validation
  • Design for Manufacturability
  • Economics of Test
  • Fault Analysis and Diagnosis
  • Fault Modeling and Simulation
  • Fault-Tolerance in HW/SW
  • Fault-Tolerant Architectures
  • Memory Test and Repair
  • On-Line Testing
  • Process Control and Measurements
  • Radiation Hardening Techniques
  • System-on-Chip Test
  • Yield Optimization

Topic Coordinators:

Analog and Mixed-Signal - M. Renovell, LIRMM, France
DFT & BIST - A. Orailoglu, UC San Diego, USA
On-Line Test and Fault Tolerance - D. K. Pradhan, University of Bristol, UK
Space Radiation - F. Lima, UFRGS, Brazil
Verification and High Level Test - M. Reorda, Politecnico di Torino, Italy
Software Testing - E. Bezerra, PUCRS, Brazil

Paper Submission Information:

Those interested in presenting recent results at the workshop are invited to submit either an ex¬tended abstract, one to three pages long, or a full length paper. PDF electronic submissions should be done via the workshop webpage: http://latw.tttc-events.org/. Authors should send papers in the IEEE format with a cover letter indicating the complete mail address, phone/fax num¬bers and e-mail addresses, the contact person and the presenter. Detailed instructions are avail¬able at the workshop webpage. The Program Committee also welcomes proposals for panels and special topic sessions. For additional information please contact one of the Program Co-Chairs:

Marcelo Lubaszewski luba@ece.ufrgs.br
Raoul Velazco raoul.velazco@imag.fr

Submission deadline: November 12th, 2007
Notification of acceptance: December 10th, 2007
Camera Ready: January 10th, 2008