INAOE ITESO Innovative Design & Test Group

Technical Program

Functional test of processor-based systems: state-of-the-art and current trends

Presenter: Matteo Sonza Reorda
Politecnico de Torino, Italy.


Matteo Sonza Reorda Biography


Variations and Edging – Twins of Electronic Systems Quality

Presenter: Manfred Dietrich
Fraunhofer Gesellschaft, Institut IIS/EAS Dresden, Germany


Manfred Dietrich Biography


Combined Effects of Ionizing Radiation and Electromagnetic Interference in Modern ICs: Comprehension and Current Solutions

Presenter: Fabian Vargas
Catholic University of Rio Grande do Sul, Brazil.


Fabian Vargas Biography


Design and Verification Methodologies for Mixed Signal IP Systems.

Presenter: Alexandro Giron
Freescale, Mexico


Alexandro Giron Biography


Reconfigurable Architectures for Safety-Critical Application

Presenter: Mario Scholzel
IHP Frankfurt (Oder) and University of Potsdam, Germany


Mario Scholzel Biography


IC Reliability: Failures, Modeling, impact and Future challenges

Presenter: Said Hamdioui
Delft University of Technology, The Netherlands


Said Hamdioui Biography


Verification of High Performance Analog Systems: from Design Specifications to Successful Silicon Implementation

Presenter: Esdras Juarez
Freescale, Mexico


Esdras Juarez Biography


Open House in Facilities of Freescale Semiconductors
Guadalajara, Jalisco

See information of Freescale
Coordinator: Federico Lobato