INAOE ITESO Innovative Design & Test Group

Technical Program Schedule

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Biannual European-Latin American Summer School on Design, Test and Reliability BELAS 2015

Campus ITESO, Auditorium Pedro Arrupe


Monday, March 23rd, 2015

8:30 Registration
9:00 Welcome and Introduction
9:30 Tutorial 1
Functional test of processor-based systems: state-of-the-art and current trends
Matteo Sonza Reorda (Politecnico de Torino, Italy)
11:00 Coffee break
11:30 Tutorial 2
Variations and Edging – Twins of Electronic Systems Quality
Manfred Dietrich (Fraunhofer Gesellschaft, Institut IIS/EAS Dresden, Germany)
13:00 Lunch
15:00 Tutorial 3
Combined Effects of Ionizing Radiation and Electromagnetic Interference in Modern ICs: Comprehension and Current Solutions
Fabian Vargas (PUCRS, Brazil )
16:30 Coffee break
17:00 Tutorial 4
Design and Verification Methodologies for Mixed Signal IP Systems
Alexandro Giron (Freescale, Mexico)
19:00 Free activities

Tuesday, March 24th, 2015

9:00 Registration
9:30 Tutorial 5
Reconfigurable Architectures for Safety-Critical Application
Mario Scholzel (IHP Frankfurt (Oder) and University of Potsdam, Germany)
11:00 Coffee break
11:30 Tutorial 6
IC Reliability: Failures, Modeling, Impact and Future Challenges
Said Hamdioui (TU Delft, The Netherlands)
13:00 Lunch
14:30 Tutorial 7
Verification of High Performance Analog Systems: from Design Specifications to Successful Silicon Implementation
Esdras Juarez (Freescale, Mexico)
16:00 Final words
16:30 Open House in Facilities of Freescale Semiconductor
Guadalajara, Jalisco
Coordinator: Federico Lobato