Reliability issues are worsening with device scaling down, while performance and quality requirements are increasing. One of the key reliability issues is long-term performance degradation due to aging. Furthermore, aging becomes more critical in complex electronic systems for safety applications (automotive, space) which must operate for many years in harsh environments.  The purpose of this  work is to investigate on novel methodologies for electronic systems aging monitoring and mitigation. Predictive error detection techniques, to be used in safety-critical, high-performance systems allows to anticipate when a system can fail due to aging. It is based on monitoring of long-term performance degradation of semiconductor systems. The proposed methodology is based on built-in aging sensors, resilient to PVT (Process, power supply Voltage and Temperature) variations. It is also important to define a methodology for built-in aging sensors insertion in the system’s architecture and in the design flow.