Call for Papers
The IEEE Latin-American Test Symposium (LATS) is a recognized forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, and security. LATS is attended by professionals from all over the world, in particular from Latin-America. Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements and the best papers of its 24th edition will be invited to re-submit to IEEE Design&Test, Journal of Electronic Testing: Theory and Applications (JETTA – Springer).
Download Call for Papers in PDF format
Topics of interest include, but are not limited to
- Design and dependability for Artificial Intelligence
- Security and Trust
- Emerging technologies and architectures
- Fault modeling, test generation, and fault simulation.
- Fault Analysis and Diagnosis
- Built-In Self-Test, and on-line testing
- Analog and mixed-signal test
- Design and Synthesis for Testability
- Design for Electromagnetic Compatibility
- Design for Reliable Embedded Software
- Validation, Verification and Diagnosis
- Fault-Tolerance in HW/SW, and Fault-Tolerant Architectures
- Memory Test
- Radiation/Electromagnetic Interference
- Hardening Techniques
- Degradation & Reliability of semiconductor devices and circuits
Key Dates
- Submission Deadline (Title, Abstract and Full Paper): January 15th, 2023 (EXTENDED DEADLINE!)
- Notification of Acceptance: January 31st, 2023
- Camera Ready manuscript and author registration: February 7th, 2023